EC5645ETTS-50.000M TR

EC5645ETTS-50.000M REGULATORY COMPLIANCE (Data Sheet downloaded on Sep 22, 2020) 2011/65 + 2015/863 191 SVHC ITEM DESCRIPTION Quartz Crystal Clock Oscillators XO (SPXO) LVCMOS (CMOS) 3.3Vdc 4 Pad 2.0mm x 2.5mm Ceramic Surface Mount (SMD) 50.000MHz ±50ppm -40°C to +85°C ELECTRICAL SPECIFICATIONS Nominal Frequency 50.000MHz Frequency Tolerance/Stability ±50ppm Maximum (Inclusive of all conditions: Calibration Tolerance at 25°C, Frequency Stability over the Operating Temperature Range, Supply Voltage Change, Output Load Change, First Year Aging at 25°C, Shock, and Vibration) Operating Temperature Range -40°C to +85°C Supply Voltage 3.3Vdc ±10% Input Current 8mA Maximum Output Voltage Logic High (Voh) 90% of Vdd Minimum (IOH= -4mA) Output Voltage Logic Low (Vol) 10% of Vdd Maximum (IOL= +4mA) Rise/Fall Time 10nSec Maximum (Measured at 20% to 80% of waveform) Duty Cycle 50 ±10(%) (Measured at 50% of waveform) Load Drive Capability 15pF Maximum Output Logic Type CMOS Pin 1 Connection Tri-State (High Impedance) Tri-State Input Voltage (Vih and Vil) 90% of Vdd Minimum or No Connect to Enable Output, 10% of Vdd Maximum to Disable Output (High Impedance) Standby Current 10µA Maximum (Disabled Output: High Impedance) RMS Phase Jitter 1pSec Maximum (12kHz to 20MHz offset frequency) Start Up Time 10mSec Maximum Storage Temperature Range -55°C to +125°C ENVIRONMENTAL & MECHANICAL SPECIFICATIONS ESD Susceptibility MIL-STD-883, Method 3015, Class 1, HBM: 1500V Fine Leak Test MIL-STD-883, Method 1014, Condition A Flammability UL94-V0 Gross Leak Test MIL-STD-883, Method 1014, Condition C Mechanical Shock MIL-STD-883, Method 2002, Condition B Moisture Resistance MIL-STD-883, Method 1004 Moisture Sensitivity J-STD-020, MSL 1 Resistance to Soldering Heat MIL-STD-202, Method 210, Condition K Resistance to Solvents MIL-STD-202, Method 215 Solderability MIL-STD-883, Method 2003 Temperature Cycling MIL-STD-883, Method 1010, Condition B Vibration MIL-STD-883, Method 2007, Condition A www.ecliptek.com | Specification Subject to Change Without Notice | Revision G 04/02/2015 | Page 1 of 4 Ecliptek, LLC 5458 Louie Lane, Reno, NV 89511 1-800-ECLIPTEK or 714.433.1200 EC5645ETTS-50.000M MECHANICAL DIMENSIONS (all dimensions in millimeters) 2.00 ±0.10 1.00 MAX 2 MARKING ORIENTATION 2.50 ±0.10 0.675 ±0.100 (x4) 3 PIN CONNECTION 1 Tri-State 2 Case/Ground 3 Output 4 Supply Voltage LINE MARKING 0.95 ±0.10 1 0.65 ±0.10 4 1 E50.0 E=Ecliptek Designator 2 XXXXX XXXXX=Ecliptek Manufacturing Identifier 0.775 ±0.100 (x4) Suggested Solder Pad Layout All Dimensions in Millimeters 1.0 (X4) 1.2 (X4) Solder Land (X4) 0.5 0.3 All Tolerances are ±0.1 www.ecliptek.com | Specification Subject to Change Without Notice | Revision G 04/02/2015 | Page 2 of 4 Ecliptek, LLC 5458 Louie Lane, Reno, NV 89511 1-800-ECLIPTEK or 714.433.1200 EC5645ETTS-50.000M CLOCK OUTPUT TRI-STATE INPUT OUTPUT WAVEFORM & TIMING DIAGRAM VIH VIL VOH 80% of Waveform OUTPUT DISABLE (HIGH IMPEDANCE STATE) 50% of Waveform 20% of Waveform VOL tPLZ Fall Time Rise Time tPZL TW T Duty Cycle (%) = TW/T x 100 www.ecliptek.com | Specification Subject to Change Without Notice | Revision G 04/02/2015 | Page 3 of 4 Ecliptek, LLC 5458 Louie Lane, Reno, NV 89511 1-800-ECLIPTEK or 714.433.1200 EC5645ETTS-50.000M Test Circuit for CMOS Output Frequency Counter Oscilloscope + + Power Supply _ Current Meter _ Supply Voltage (VDD) Probe (Note 2) Output + Voltage Meter _ 0.01µF (Note 1) 0.1µF (Note 1) Ground CL (Note 3) Tri-State Note 1: An external 0.01µF ceramic bypass capacitor in parallel with a 0.1µF high frequency ceramic bypass capacitor close (less than 2mm) to the package ground and supply voltage pin is required. Note 2: A low capacitance (10Mohms), and high bandwidth (>300MHz) passive probe is recommended. Note 3: Capacitance value CL includes sum of all probe and fixture capacitance. www.ecliptek.com | Specification Subject to Change Without Notice | Revision G 04/02/2015 | Page 4 of 4 Ecliptek, LLC 5458 Louie Lane, Reno, NV 89511 1-800-ECLIPTEK or 714.433.1200